2. X-Ray Diffractometer (XRD)

Instrument model: D8advance

Manufacturer: Bruker (Germany)

Function: It is mainly used for the accurate analysis of the binding state between elements in solid materials, i.e. phase and crystal structure, including qualitative and semi quantitative analysis of each phase, determination of crystal system, and analysis of grain size, distortion, etc.

3. Automatic Gas Sorption Analyzer (BET)

Instrument model: autosorb-iQ

Manufacturer: Cantor (USA)

Function: It is mainly used in the specific surface area measurement, specific surface area and pore size distribution of mesoporous materials, pore size distribution of microporous materials.

4. Field Emission Scanning Electron Microscope (SEM)

Instrument model:apreohivac

Manufacturer:Fei (USA)

Function: It is mainly used to observe the surface and section morphology of materials. The equipment is designed in dual objective lens with low-voltage imaging technology. There are no restrictions on the observing samples (magnetic, non-magnetic, conductive, non-conductive, etc.) and the equipment can directly observe the fine structure of uneven surface of various samples. High performance X-ray energy dispersive spectrometer can be used for micro area morphology and composition analysis.

5. Tungsten Filament High and Low Vacuum Scanning Electron Microscopy (SEM)

Instrument model: JSM-6360LV

Manufacturer: jeol

Function: Analysis of micro morphology of solid material surface and composition of micro area surface.

6. Synchronous Thermal Analyzer (TGA / DSC)

Instrument model: sta449f5

Manufacturer: Netzsch (Germany)

Function: It is mainly used to test the thermal decomposition temperature, and can measure the heat flow of DSC synchronously, and can analyze the physical and chemical changes such as melting, crystallization, phase transformation, redox, adsorption, and desorption.

7. UV / Vis / NIR Spectrophotometer

Instrument model:uh4150

Manufacturer: Hitachi

Function: It can detect the transmittance, reflectivity and absorption curve of things like bulk, film and powder samples in the range of 185 to 3300nm; it can collect the UV / Vis / NIR absorption curve of liquid samples, which can be used for qualitative analysis of structure, and quantitative analysis of components of samples.

8. Inductively Coupled Plasma - Analytical Emission Spectrometer (ICP-AES)

Instrument model: Avio 200

Manufacturer: Perkin Elmer

Function: It is mainly used for the analysis of trace elements. The analyzable elements are most metals and a small amount of nonmetal such as silicon, phosphorus and sulfur.

9. Fourier Transform Infrared Spectrometer

Instrument model: Nicolet is 50

Manufacturer: Thermo Fisher (America)

Function: It is used to identify the structure and group of inorganics, organic and polymer materials, analyze the molecular structure and material types, and study the interaction within and between molecules.

10. Laser Confocal Micro Raman Spectrometer

Instrument model: invia

Manufacturer: Renishaw (UK)

Function: Raman spectroscopy can reflect information like the chemical composition, state, polymerization, application and orientation of materials. It has been widely used in the research of films, coatings, integrated circuits, mineral inclusions, etc.

11. Ferroelectric Analyzer

Instrument model: TFanalyzer 3000

Manufacturer: aixaccT

Function: This equipment has all the basic characteristics test functions of ferroelectric, piezoelectric and pyroelectric materials, including dynamic hysteresis loop, static hysteresis loop, fatigue test, retention force test, imprint test, leakage current test,pund pulse test, capacitance-voltage curve, current-voltage curve, current-time curve, butterfly curve test, d33 test, piezoelectric coefficient test, etc.

12. Dielectric Impedance Analyzer

Instrument model: BDS 50

Manufacturer: Novocontrol (Germany)

Function: At room temperature and frequency conversion, the dielectric property parameters of the material, such as dielectric constant, tangent tangent of dielectric loss Angle, conductivity, and more than 30 other parameters, are accurately measured. The instrument is equipped with an active sample stand to reduce the external influence on the measurement results and improve the measurement accuracy.

13. Plasma Enhanced Atomic Layer Deposition System

Instrument model: Savannah G2 S200

Manufacturer: Ultratech (USA)

Function: Nanoscale film deposition of atomic layer can be prepared by thermal method and plasma method. Nitrides, oxides and metal films can be deposited. The instrument is equipped with a powder deposition device, which can deposit thin films on nanometer powder or particles.

14. Four Probes

Instrument model: 280si

Manufacturer: Four Dimensions

Function: It is used to test the resistivity and block resistance of semiconductor materials.