At the invitation of the Material Analysis Laboratory of the School of Advanced Materials and Nanotechnology, Dr. Gert Nolze, a crystallographer from the Federal Institute for Materials Research and Testing in Germany (BAM), visited Xidian University for academic exchange from October 25 to 26, 2013. On the morning of October 25, Dr. Gert Nolze delivered an academic report entitled “EBSD Fundamentals and Challenges in the Investigation of Semiconductor Materials” for teachers and students in the Conference Room, Fourth Floor, West Building. This seminar was presided over by Professor Ma Xiaohua of the Preparatory Group of the School of Advanced Materials and Nanotechnology.

EBSD (Electron Back-Scattered Diffraction), as an important method for micro-domain phase analysis of materials, has been widely used in the research of metals, alloys, ceramics and semiconductors. Dr. Gert Nolze briefly introduced EBSD technology, specified many classic examples of his application in various materials research fields for many years, and patiently answered students’ questions. The academic report was full and accurate in content and novel in subject. The report presentation by him broadened the academic vision of teachers and students and was warmly welcomed by every participant.

On the afternoon of October 25, Dr. Gert Nolze gave specific application guidance on EBSD test and analysis of Substrate materials for graphene growth in the Material Analysis Laboratory, and discussed the test methods, sample preparation techniques and test and analysis condition optimization of this technology in the characterization and analysis of various semiconductor materials.

Dr. Gert Nolze is a crystallographer and now works at the Federal Institute for Materials Research and Testing in Germany as the head of “Local Phase Analysis and Microstructure Characterization of Materials in Scanning Electron Microscope” Research Group. Dr. Gert Nolze majored in crystallography at Leipzig University during doctoral programme. His doctoral dissertation is titled as “Systematic Characterization of Non-centrosymmetric Crystals by Kossel Diffraction”.

Since 1990, he has worked at the Federal Institute for Materials Research and Testing in Germany. After work, he has also invented the software PowderCell, which isafree software for X-ray diffraction simulation and is still one of the most frequently viewed and downloaded software in the research field. Since 2000, his research interest has turned to EBSD, and his main research topic “EBSD Characterization of Microstructure in Scanning Electron Microscope” has won the research fund of Germany. As the initiator and head of EBSD in Germany, he organizes the annual conference of EBSD in Germany every year to discuss EBSD methods and provide a platform for technicians and engineers engaged in EBSD to share experience and information. At present, he mainly studies how to simplify EBSD analysis technology and explore new EBSD methods.